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YieldMaxxTM


Category: DFM

Ridgetop’s Independent Die-Level Fab Process Monitoring Tools
The quick identification and correction of yield problems is an imperative issue that can be simply solved by YieldMaxx. Interfacing through an API with independent die-level process monitoring tools, YieldMaxx integrates large volumes of disparate data to provide accurate yield analysis in a matter of minutes. The user is able to correct the disparity faster due to an automated test equipment database.

Description

The quick identification and correction of yield problems is an imperative issue that can be simply solved by YieldMaxx. Interfacing through an API with independent die-level process monitoring tools, YieldMaxx integrates large volumes of disparate data to provide accurate yield analysis in a matter of minutes. The user is able to correct the disparity faster due to an automated test equipment database.The software analyzes and presents standard on-die, parametric data measurements of key performance parameters, such as threshold voltage, resistance, and capacitance. With a friendly GUI, YieldMaxx displays visual indications of device mismatch parameters.
YieldMaxx allows foundries, IDMs, or design houses to rapidly analyze critical process control monitor parameters to sort and display them for quick interpretation and yield-related trade-off decisions.

Features & Benefits

  • Utilizes standard or proprietary DLPM analysis tools
  • Customizable reports
  • Displays die-level process-induced variance
  • Performs with any process monitoring tools
  • Expedites problem resolution
  • Insignificant processing latency
  • Operates in Windows
  • Multi-configurable input format
  • Provides support code