Semiconductor Solutions

Our technologies provide a large variety of solutions to the semiconductor industry. An overview of these technologies is provided in the FYRE catalog, which compiles solutions that address

Functionality: InstaCell™ Mixed-Signal Library
Yield Enhancement: nanoDFM™, including PDKChek® and YieldMaxx®
Reliability: Sentinel Silicon™, ProChek™, and Q-Star Test™, SIA & SSA
Engineering Services

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Our cores are "Silicon Proven" and have documented reports available. Our cores can be used in IBM, TSMC,...


ProChek™ Semiconductor Reliability Characterization - This compact, precision system extracts semiconductor...


Ridgetop’s nanoDFM technologies apply advanced and patented in-situ test structures and iterative improvements....

Product Image Name Description Category Manufacturer

ProChek™ Semiconductor Process Characterization System
This compact, precision system extracts semiconductor parameters from deep submicron parameters faster and more cost-effectively than other method. Process parameters include TDDB, HCI, stress migration, NBTI, PBTI and others.

PROCHEK™ Ridgetop Group
SIA-4000 series

Configurable with up to 8 differential channels measuring data rates to 15 Gb/s with 200 femtosecond resolution.
Includes full functioning, color gradient 15 GHz sampling oscilloscope.

Signal Integrity Analyser GIGAMAX

Ridgetop has the technical experience and proven results for critical aerospace, automotive, and semiconductor sectors. Our ADC IP library includes:
Rad-hard ADCs for aerospace and military applications
Non-rad-hard ADCs for commercial applications

InstaCell™ Ridgetop Group

The Only General Purpose Clock Tool Available
Interact with colleagues on familiar terms: Frequency, Amplitude or Time
*Translate domains using the “Rosetta Stone” of instruments
*Address requirements of Telecom, SONET, Military/Aerospace and PC/Server datacom markets
*Meet the widest range of oscillator test specifications

Signal Source Analyzers GIGAMAX

Testin this.

IP SP Devices
Q-Star Test

This line of precision current measurement instruments has been adopted world-wide by over 70 firms involved in characterization and manufacturing of ICs across a broad range of electronics applications. A wide array of product capabilities and design services are available.For more information on Q-Star Test products

Q-Star Test Ridgetop Group

Fabless designers rely on the accuracy of the process design kit (PDK) supplied by the foundry in accounting for the statistical nature of the offset voltages. However, a foundry PDK does not exactly model all choices of devices. At process geometries of 130 nm and below, the designer requires a tool like PDKChek to accurately determine the relevant parameters for the specific devices used in the design (width and length choices). Figure below describes the PDKChek system-level implementation. The ∆VT, ∆R, and ∆C sensors are available, and the inductance sensor is currently being tested.

DFM Ridgetop Group
Sentinel Silicon

Sentinel Silicon library includes precision measurement structures for:
TDDB - Time Dependent Dielectric Breakdown
HCI - Hot Carrier Damage
NBTI - Negative Bias Temperature Instability
Radiation Damage - RadCell Fox (Field Oxide) and RadCell VT (Threshold Voltage)

Sentinel IP Solutions Ridgetop Group