PROCHEK™

Ridgetop Group’s ProChek is an innovative system to qualify the performance and characterize the intrinsic reliability of deep submicron nanotechnology CMOS processes for microelectronics applications. ProChek is designed to provide fast and reliable measurement of critical electrical performance parameters.

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PROCHEK™

ProChek™ Semiconductor Process Characterization System
This compact, precision system extracts semiconductor parameters from deep submicron parameters faster and more cost-effectively than other method. Process parameters include TDDB, HCI, stress migration, NBTI, PBTI and others.

PROCHEK™ Ridgetop Group